Synthesizes recent findings on the chance of missing a faulty circuit when the data from testing microelectronic systems is compacted to be more manageable, a situation known as aliasing. Considers single and multiple stuck-at, delay, and stuck-open faults. Also reviews the testing of VLSI, introduc
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Synthesizes recent findings on the chance of missing a faulty circuit when the data from testing microelectronic systems is compacted to be more manageable, a situation known as aliasing. Considers single and multiple stuck-at, delay, and stuck-open faults. Also reviews the testing of VLSI, introduc
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Add this copy of A Probabilistic Analysis of Test Response Compaction to cart. $71.23, new condition, Sold by Just one more Chapter rated 3.0 out of 5 stars, ships from Miramar, FL, UNITED STATES, published 1995 by Institute of Electrical & Electronics Engineers(IEEE).
Edition:
1995, Institute of Electrical & Electronics Engineers(IEEE)
