Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technologies, and are outlined here. Read More

Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technologies, and are outlined here. Read Less

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  	This is a digital edition of this title. Rent eBook (5 Options) 30 Day Rental: £24.89 (Expires Dec 07, 2025) 60 Day Rental: £33.18 (Expires Jan 06, 2026) 90 Day Rental: £41.48 (Expires Feb 05, 2026) 120 Day Rental: £49.77 (Expires Mar 07, 2026) 180 Day Rental: £53.92 (Expires May 06, 2026) Buy eBook Lifetime Access: £82.95 Title: Advanced Test Methods for Srams by Alberto Bosio; Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel Publisher: Springer Nature Print ISBN: 9781441909374, 1441909370 eText ISBN: 9781441909381 Edition: 2009 2010 edition Format: EPUB eBook	£24.89 Rent eBook This is a digital eBook Nothing will be shipped to you Works with web browsers and the VitalSource app on all Windows, Mac, Chromebook, Kindle Fire, iOS, and Android devices Most eBooks are returnable within 14 days of purchase Questions? See our eBook FAQ