Advances in solid state detector arrays, flat panel displays and digital image processing have prompted an increasing variety of sampled imaging products and possibilities. These technology developments provide new opportunities and problems for the design engineer and system analyst - this tutorial's intended reader.
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Advances in solid state detector arrays, flat panel displays and digital image processing have prompted an increasing variety of sampled imaging products and possibilities. These technology developments provide new opportunities and problems for the design engineer and system analyst - this tutorial's intended reader.
Read Less
Add this copy of Analysis of Sampled Imaging Systems to cart. $26.98, good condition, Sold by ThriftBooks-Atlanta rated 5.0 out of 5 stars, ships from Austell, GA, UNITED STATES, published 1999 by SPIE-International Society for Optical Engine.
Edition:
1999, SPIE-International Society for Optical Engineering
Add this copy of Analysis of Sampled Imaging Systems (Spie Tutorial to cart. $26.99, good condition, Sold by HPB-Red rated 5.0 out of 5 stars, ships from Dallas, TX, UNITED STATES, published 2000 by SPIE Publications.
Edition:
1999, SPIE-International Society for Optical Engineering
Publisher:
SPIE-International Society for Optical Engineering
Published:
2000
Language:
English
Alibris ID:
18289938729
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Add this copy of Analysis of Sampled Imaging Systems (Spie Tutorial to cart. $60.14, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 2000 by SPIE Publications.
Edition:
1999, SPIE-International Society for Optical Engineering
