This book will introduce test and design engineers to new techniques that can be used to improve testing and quality of a wide range of circuits.This book explains what arithmetic built-in self-test (BIST) is, and how it can be used in a wide variety of circuits. It shows how BIST can support new design methodologies that rely on hardware/software co-design, DSP cores and embedded processors.Hardware/embedded system designers, test engineers, researchers working on IC/core testing, and graduate students.
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This book will introduce test and design engineers to new techniques that can be used to improve testing and quality of a wide range of circuits.This book explains what arithmetic built-in self-test (BIST) is, and how it can be used in a wide variety of circuits. It shows how BIST can support new design methodologies that rely on hardware/software co-design, DSP cores and embedded processors.Hardware/embedded system designers, test engineers, researchers working on IC/core testing, and graduate students.
Read Less
Add this copy of Arithmetic Built-in Self-Test for Embedded Systems to cart. $106.99, new condition, Sold by GridFreed rated 5.0 out of 5 stars, ships from North Las Vegas, NV, UNITED STATES, published 1997 by Prentice Hall.