Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
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Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
Read Less
Add this copy of Introduction to Focused Ion Beams to cart. $98.43, new condition, Sold by Books2anywhere rated 5.0 out of 5 stars, ships from Fairford, GLOUCESTERSHIRE, UNITED KINGDOM, published 2010 by Springer.
Edition:
Softcover reprint of hardcover 1st edition 2005
Publisher:
Springer-Verlag New York Inc.
Published:
10/29/2010 12: 00: 00 AM
Language:
English
Alibris ID:
18242812731
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PLEASE NOTE, WE DO NOT SHIP TO DENMARK. New Book from multilingual publisher. Shipped from UK within 4 to 14 days. Please check language within the description.
Add this copy of Introduction to Focused Ion Beams to cart. $104.57, new condition, Sold by Paperbackshop International rated 1.0 out of 5 stars, ships from Fairford, GLOS, UNITED KINGDOM, published 2010 by Springer.
Edition:
Softcover reprint of hardcover 1st edition 2005
Publisher:
Springer-Verlag New York Inc.
Published:
10/29/2010 12: 00: 00 AM
Language:
English
Alibris ID:
18242817840
Shipping Options:
Standard Shipping: $4.90
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Seller's Description:
PLEASE NOTE, WE DO NOT SHIP TO DENMARK. New Book from multilingual publisher. Shipped from UK within 4 to 14 days. Please check language within the description.
Add this copy of Introduction to Focused Ion Beams: Instrumentation, to cart. $108.01, new condition, Sold by Booksplease rated 4.0 out of 5 stars, ships from Southport, MERSEYSIDE, UNITED KINGDOM, published 2010 by Springer-Verlag New York Inc..
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New. Contains: Illustrations, black & white, Illustrations, color. XVII, 357 p. 34 illus., 28 illus. in color. Intended for professional and scholarly audience.
Add this copy of Introduction to Focused Ion Beams: Instrumentation, to cart. $108.89, new condition, Sold by GreatBookPricesUK5 rated 4.0 out of 5 stars, ships from Castle Donington, DERBYSHIRE, UNITED KINGDOM, published 2010 by Springer-Verlag New York Inc..
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New. Contains: Illustrations, black & white, Illustrations, color. XVII, 357 p. 34 illus., 28 illus. in color. Intended for professional and scholarly audience. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Introduction to Focused Ion Beams: Instrumentation, to cart. $111.80, like new condition, Sold by GreatBookPricesUK5 rated 4.0 out of 5 stars, ships from Castle Donington, DERBYSHIRE, UNITED KINGDOM, published 2010 by Springer-Verlag New York Inc..
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Fine. Contains: Illustrations, black & white, Illustrations, color. XVII, 357 p. 34 illus., 28 illus. in color. Intended for professional and scholarly audience. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Introduction to Focused Ion Beams to cart. $116.14, new condition, Sold by Paperbackshop rated 4.0 out of 5 stars, ships from Bensenville, IL, UNITED STATES, published 2010 by Springer.
Add this copy of Introduction to Focused Ion Beams: Instrumentation, to cart. $125.00, new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 2010 by Springer-Verlag New York Inc..
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New. Contains: Illustrations, black & white, Illustrations, color. XVII, 357 p. 34 illus., 28 illus. in color. Intended for professional and scholarly audience. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Introduction to Focused Ion Beams: Instrumentation, to cart. $149.66, new condition, Sold by Ria Christie Books rated 4.0 out of 5 stars, ships from Uxbridge, MIDDLESEX, UNITED KINGDOM, published 2010 by Springer-Verlag New York Inc..
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Seller's Description:
New. Contains: Illustrations, black & white, Illustrations, color. XVII, 357 p. 34 illus., 28 illus. in color. Intended for professional and scholarly audience.
