Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Read More

This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Read Less

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  	This is a digital edition of this title. Rent eBook (5 Options) 30 Day Rental: £26.61 (Expires Oct 31, 2025) 60 Day Rental: £35.47 (Expires Nov 30, 2025) 90 Day Rental: £44.34 (Expires Dec 30, 2025) 120 Day Rental: £53.21 (Expires Jan 29, 2026) 180 Day Rental: £57.64 (Expires Mar 30, 2026) Buy eBook Lifetime Access: £88.68 Title: Scanning Electron Microscopy and X-Ray Microanalysis by Joseph Goldstein; Dale E. Newbury; David C. Joy; Charles E. Lyman; Patrick Echlin; Eric Lifshin; Lin Publisher: Springer Nature Print ISBN: 9781461349693, 1461349699 eText ISBN: 9781461502159 Edition: 2013 3rd edition Format: PDF eBook	£26.61 Rent eBook This is a digital eBook Nothing will be shipped to you Works with web browsers and the VitalSource app on all Windows, Mac, Chromebook, Kindle Fire, iOS, and Android devices Most eBooks are returnable within 14 days of purchase Questions? See our eBook FAQ