This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis.
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This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis.
Read Less
Add this copy of Scanning Electron Microscopy and X-Ray Microanalysis: to cart. £40.92, very good condition, Sold by A Book Corner rated 5.0 out of 5 stars, ships from Beaverton, OR, UNITED STATES, published 2003 by Springer.
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Very good. Hardback. No dust jacket. Cover edges and corners in good shape. Cover in good shape with some minimal signs of normal wear. There is a very small sticker on spine at bottom. Spine is a bit loose at top and tight at bottom. Pages are clean, no markings, notes or stains. Includes CD. Ships from Friends bookstore to benefit Beaverton (Oregon) library.
Add this copy of Scanning Electron Microscopy and X-Ray Microanalysis: to cart. £40.92, good condition, Sold by HPB-Red rated 5.0 out of 5 stars, ships from Dallas, TX, UNITED STATES, published 2003 by Springer.
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Add this copy of Scanning Electron Microscopy and X-Ray Microanalysis: to cart. £40.92, fair condition, Sold by St. Vinnie's Books rated 4.0 out of 5 stars, ships from Eugene, OR, UNITED STATES, published 2003 by Springer.
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Acceptable. COVER SHOWS SOME GENERAL WEAR, SUCH AS SCRATCHES, RUBBING, CREASES OR COSMETIC DAMAGE. hardcover 100% of proceeds go to charity! Acceptable reading copy with obvious signs of use, wear, and/or cosmetic issues. Item is complete and remains readable despite notable condition issues.
Add this copy of Scanning Electron Microscopy and X-Ray Microanalysis: to cart. £76.92, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 2003 by Springer.
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