Scanning tunneling microscopy (STM), invented by Binnig and Rohrer in 1982, enables one to obtain images reflecting surface electronic structure with atomic resolution. As an offshoot of this technology, Binnig, Quate and Gerber in 1986 invented atomic force microscopy (AFM), also capable of achieving atomic resolution. By now this technology proved to be an indispensable characterization tool with applications to surface physics and chemistry, material science, bio-science and data storage media, with promise in such areas ...
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Scanning tunneling microscopy (STM), invented by Binnig and Rohrer in 1982, enables one to obtain images reflecting surface electronic structure with atomic resolution. As an offshoot of this technology, Binnig, Quate and Gerber in 1986 invented atomic force microscopy (AFM), also capable of achieving atomic resolution. By now this technology proved to be an indispensable characterization tool with applications to surface physics and chemistry, material science, bio-science and data storage media, with promise in such areas as the semiconductor industry and optical quality control, for example. This book is the first attempt at organizing the whole rainbow of rapidly developing topics dealing with the mapping of a variety of forces across surfaces. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book a valuable source of up-to-date information.
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Add this copy of Scanning Force Microscopy: With Applications to to cart. $165.94, like new condition, Sold by GreatBookPricesUK5 rated 5.0 out of 5 stars, ships from Castle Donington, DERBYSHIRE, UNITED KINGDOM, published 1994 by Oxford University Press.
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Add this copy of Scanning Force Microscopy: With Applications to to cart. $176.56, new condition, Sold by GreatBookPricesUK5 rated 5.0 out of 5 stars, ships from Castle Donington, DERBYSHIRE, UNITED KINGDOM, published 1994 by Oxford University Press.
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New. Sewn binding. Cloth over boards. 288 p. Contains: Unspecified. Oxford Optical and Imaging Sciences, 5. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Scanning Force Microscopy: With Applications to to cart. $176.77, like new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 1994 by Oxford University Press.
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Seller's Description:
Fine. Sewn binding. Cloth over boards. 288 p. Contains: Unspecified. Oxford Optical and Imaging Sciences, 5. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
