Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

Providing readers with systematic treatments of statistical modeling and analysis of VLSI systems, this volume presents the latest developments in the field. Readers will find an analysis of each algorithm with practical applications in the context of real circuit design. Read More

Providing readers with systematic treatments of statistical modeling and analysis of VLSI systems, this volume presents the latest developments in the field. Readers will find an analysis of each algorithm with practical applications in the context of real circuit design. Read Less

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  	This is a digital edition of this title. Rent eBook (5 Options) 30 Day Rental: $29.70 (Expires Jul 25, 2025) 60 Day Rental: $39.60 (Expires Aug 24, 2025) 90 Day Rental: $49.50 (Expires Sep 23, 2025) 120 Day Rental: $59.40 (Expires Oct 23, 2025) 180 Day Rental: $64.35 (Expires Dec 22, 2025) Buy eBook Lifetime Access: $99.00 Title: Statistical Performance Analysis and Modeling Techniques for Nanometer Vlsi Designs by Ruijing Shen; Sheldon X. -D. Tan; Hao Yu Publisher: Springer Nature Print ISBN: 9781461407874, 1461407877 eText ISBN: 9781461407881 Edition: 2012 Format: EPUB eBook	$29.70 Rent eBook This is a digital eBook Nothing will be shipped to you Works with web browsers and the VitalSource app on all Windows, Mac, Chromebook, Kindle Fire, iOS, and Android devices Most eBooks are returnable within 14 days of purchase Questions? See our eBook FAQ