Researchers in microscopy, practitioners in biology, materials science, engineering and physics.
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Researchers in microscopy, practitioners in biology, materials science, engineering and physics.
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1998, American Institute of Physics
ISBN-13:
9780883188163
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Hawthorne,
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$150.59
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Add this copy of Scanned Probe Microscopy. Aip Conference Proceedings, to cart. $150.59, new condition, Sold by Media Smart rated 4.0 out of 5 stars, ships from Hawthorne, CA, UNITED STATES, published 1998 by American Institute of Physics.
Edition: 1998, American Institute of Physics
Hardcover,
New
Details: ISBN:
0883188163
ISBN-13:
9780883188163
Pages:
564
Publisher:
American Institute of Physics
Published:
1998
Language:
English
Alibris ID:
18176703889
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Seller's Description: New. P 563 1st Edition.
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ISBN-13: 9780883188163
Hardcover
