With test methodologies and data analysis techniques that apply to all imaging systems and detector array characterizations, including visible, near infrared, short-wavelength infrared (SWIR), mid-wavelength infrared (MWIR) and long-wavelength infrared (LWIR), Holst has updated this edition to include current practice of capturing the data with a frame grabber for computer analysis. He also clarifies the concept of target background delta-T and updates chapters on noise and modulation transfer function (MTF) measurements. ...
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With test methodologies and data analysis techniques that apply to all imaging systems and detector array characterizations, including visible, near infrared, short-wavelength infrared (SWIR), mid-wavelength infrared (MWIR) and long-wavelength infrared (LWIR), Holst has updated this edition to include current practice of capturing the data with a frame grabber for computer analysis. He also clarifies the concept of target background delta-T and updates chapters on noise and modulation transfer function (MTF) measurements. He covers infrared (IR) imaging system operation, IR technology, general measuring techniques, focus and system resolution, system responsivity, system noise, transfer functions (modulation, phase and contrast, geometric transfer function, observer interpretation of image quality, automated testing and uncertainty analysis. Holst builds from basic material to that which is more advanced, making this a suitable for both self-study and the classroom, and his illustrations are well-chosen.
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Add this copy of Testing and Evaluation of Infrared Imaging Systems to cart. $185.16, new condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 2008 by Society of Photo Optical.
Edition:
2008, SPIE-International Society for Optical Engineering
Add this copy of Testing and Evaluation of Infrared Imaging Systems to cart. $228.49, new condition, Sold by Just one more Chapter rated 3.0 out of 5 stars, ships from Miramar, FL, UNITED STATES, published 1998 by J C D Pub.
Edition:
1998, SPIE-International Society for Optical Engineering
