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  Image Analysis Sourcebook

  by John Keith Beddow, PhD

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  Particle Characterization in Technology: Volume II: Morphological Analysis

  by John Keith Beddow, PhD

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Additional copies that match your search:

• 1. Image Analysis Sourcebook

  by Beddow, John Keith, PhD

   
  

  

  Seller Description: New. Sewn binding. Paper over boards. 390 p. Contains: Illustrations. See More Details

  1997, American Universities Science & Technology Press ISBN-13: 9780961753177 Hardcover, New

  Just one more Chapter AVERAGE Miramar, FL, USA

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