The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and ...
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The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.
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Add this copy of High Resolution X-Ray Diffractometry And Topography to cart. $262.79, like new condition, Sold by GreatBookPricesUK5 rated 4.0 out of 5 stars, ships from Castle Donington, DERBYSHIRE, UNITED KINGDOM, published 1998 by CRC Press.
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Fine. Sewn binding. Cloth over boards. 262 p. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of High Resolution X-Ray Diffractometry And Topography to cart. $263.84, new condition, Sold by GreatBookPricesUK5 rated 4.0 out of 5 stars, ships from Castle Donington, DERBYSHIRE, UNITED KINGDOM, published 1998 by CRC Press.
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New. Sewn binding. Cloth over boards. 262 p. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of High Resolution X-Ray Diffractometry and Topography to cart. $287.76, new condition, Sold by Ria Christie Books rated 4.0 out of 5 stars, ships from Uxbridge, MIDDLESEX, UNITED KINGDOM, published 1998 by CRC Press.
Add this copy of High Resolution X-Ray Diffractometry and Topography to cart. $104.95, very good condition, Sold by Mahler Books rated 5.0 out of 5 stars, ships from Pflugerville, TX, UNITED STATES, published 1998 by CRC Press.
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Very Good. 0850667585. Gift inscription by Author to fly leaf. This book is in very good condition; no remainder marks. It does have some cover shelfwear. Inside pages are clean.; 24.6 X 17.4 X 1.56 centimeters; 264 pages.
Add this copy of High Resolution X-Ray Diffractometry and Topography to cart. $193.01, good condition, Sold by HPB-Red rated 5.0 out of 5 stars, ships from Dallas, TX, UNITED STATES, published 1998 by CRC Press.
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Add this copy of High Resolution X-Ray Diffractometry And Topography to cart. $243.85, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 1998 by CRC Press.
