This text describes recent developments in optical techniques for extracting surface and interface information with a resolution of less than a single atomic layer. These "epioptic" techniques are now widely applied to semiconductor surfaces and interfaces and include polarised reflection techniques such as reflection anisotropy spectroscopy and spectroscopic ellipsometry, Raman scattering, and optical second harmonic and sum frequency generation. Epioptics has great potential in the area of growth monitoring, and in situ ...
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This text describes recent developments in optical techniques for extracting surface and interface information with a resolution of less than a single atomic layer. These "epioptic" techniques are now widely applied to semiconductor surfaces and interfaces and include polarised reflection techniques such as reflection anisotropy spectroscopy and spectroscopic ellipsometry, Raman scattering, and optical second harmonic and sum frequency generation. Epioptics has great potential in the area of growth monitoring, and in situ monitoring of semiconductor growth with submonolayer sensitivity has now been demonstrated in growth reactors under normal operating conditions. The book emphasizes recent studies of submonolayer growth on semiconductor surfaces.
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Add this copy of Epioptics: Linear and Nonlinear Optical Spectroscopy of to cart. $21.97, good condition, Sold by Anybook rated 5.0 out of 5 stars, ships from Lincoln, UNITED KINGDOM, published 1995 by Springer.
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This is an ex-library book and may have the usual library/used-book markings inside. This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item, 550grams, ISBN: 9783540594109.
Add this copy of Epioptics: Linear and Nonlinear Optical Spectroscopy of to cart. $53.57, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 1995 by Springer.
